Tuesday, December 2, 2014

FEI Company: Giving Visibility to the Smallest of Things


Sometimes the smallest defect can make a difference on the total performance of the entire system. With the detection of these miniscule errors, companies are able to save millions in their production phase and even enhance the quality of their items. This is what FEI Company is good at, the production of devices that are capable of detecting the smallest errors and parts of a huge system.

The company’s products make a lot of difference in the arena of the electronic industry. By incorporating their proprietary technology to the workflow and devices of their clients, they are able to roll out failure analysis, 3D metrology, TEM sample preparation and defect analysis. Created in 1971, the scientific and technical instruments offered by the business have made an impact to a wide array of industries, including in Life Sciences, Industrial Manufacturing, Natural Resources and in Materials Science.

FEI has more than 60 years of expertise in microscopy workflows. They have helped industries, innovate, develop and accelerate breakthrough discoveries that have led to the creation of new therapeutics, new gadgets and other technological enhancements. The products and services of the business provide visibility and images in various scales, including in nano-, micro- and picometer sizes.

The products of the company include scanning electron microscopes, focusing columns, transmission electron microscopes and focused ion beam workstations. Their products are marketed to more than 50 countries, where they also maintain service operations and sales. The company’s main office is located in Hillsboro, Oregon while they also maintain research and development centers in Germany, Japan, China, Australia, The Netherlands and in Czech Republic. It continues to innovate its offerings to further enhance and give life to the smallest of things.

The company is publicly traded on the NASDAQ under the symbol FEIC. It is a component of the Russell 3000 Index.

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